Welcome to UE Central Library

Keep Smiling

Solid state electronic devices / Ben G. Streetman

By: Contributor(s): Material type: TextTextPublication details: NBF, Islamabad :Edition: 5th edDescription: xviii, 558 pSubject(s): DDC classification:
  • 621.38152 S9154
Contents:
1. Crystal Properties and Growth of Semiconductors -- 2. Atoms and Electrons -- 3. Energy Bands and Charge Carriers in Semiconductors -- 4. Excess Carriers in Semiconductors -- 5. Junctions -- 6. Field-Effect Transistors -- 7. Bipolar Junction Transistors -- 8. Optoelectronic Devices -- 9. Integrated Circuits -- 10. Negative Conductance Microwave Devices -- 11. Power Devices -- App. I. Definitions of Commonly Used Symbols -- App. II. Physical Constants and Conversion Factors -- App. III. Properties of Semiconductor Materials -- App. IV. Derivation of the Density of States in the Conduction Band -- App. V. Derivation of Fermi-Dirac Statistics -- App. VI. Dry and Wet Thermal Oxide Thickness as a Function of Time and Temperature.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
Books Books UE-Central Library 621.38152 S9154 (Browse shelf(Opens below)) Available T542D
Books Books UE-Central Library 621.38152 S9154 (Browse shelf(Opens below)) Available T247D

includes index

1. Crystal Properties and Growth of Semiconductors --
2. Atoms and Electrons --
3. Energy Bands and Charge Carriers in Semiconductors --
4. Excess Carriers in Semiconductors --
5. Junctions --
6. Field-Effect Transistors --
7. Bipolar Junction Transistors --
8. Optoelectronic Devices --
9. Integrated Circuits --
10. Negative Conductance Microwave Devices --
11. Power Devices --
App. I. Definitions of Commonly Used Symbols --
App. II. Physical Constants and Conversion Factors --
App. III. Properties of Semiconductor Materials --
App. IV. Derivation of the Density of States in the Conduction Band --
App. V. Derivation of Fermi-Dirac Statistics --
App. VI. Dry and Wet Thermal Oxide Thickness as a Function of Time and Temperature.

There are no comments on this title.

to post a comment.
Copyright © 2023, University of Education, Lahore. All Rights Reserved.
Email:centrallibrary@ue.edu.pk