Materials characterization techniques / (Record no. 16271)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02294cam a2200229 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | 15362017 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200611131340.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 080710s2009 flua b 001 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781420042948 (alk. paper) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 1420042947 (alk. paper) |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | DLC |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 620.1/10287 |
| Edition number | 22 |
| Item number | Z632 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Zhang, Sam. |
| 245 10 - TITLE STATEMENT | |
| Title | Materials characterization techniques / |
| Statement of responsibility, etc | Sam Zhang, Lin Li, Ashok Kumar. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc | Boca Raton : |
| Name of publisher, distributor, etc | CRC Press, |
| Date of publication, distribution, etc | 2009 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 328 p. : |
| Other physical details | ill. ; |
| Dimensions | 25 cm. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Materials |
| General subdivision | Testing. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Li, L. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Kumar, Ashok, |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | PrefaceIntroductionContact Angle in Surface; AnalysisMeasuring Contact AngleDetermining Surface Energy of a Homogeneous Solid SurfaceWork ExamplesX-ray; Photoelectron Spectroscopy and Auger Electron; SpectroscopyAtomic Model and Electron; ConfigurationPrinciples of XPS and AESInstrumentationRoutine Limits of XPSXPS Applications and Case StudiesAES ApplicationsScanning Tunneling; Microscopy and Atomic Force MicroscopyWorking; PrincipleInstrumentationModes of OperationDifferences between STM and AFMApplicationsX-ray DiffractionX-ray; Characteristics and GenerationLattice Planes and Bragg's; LawPowder DiffractionThin Film DiffractionTexture; MeasurementGrazing Angle X-ray DiffractionTransmission; Electron MicroscopyBasics of Transmission Electron; MicroscopesReciprocal LatticeSpecimen PreparationBright-Field and Dark-Field ImagesElectron Energy Loss; SpectroscopyScanning Electron MicroscopyIntroduction to Scanning Electron MicroscopesElectron Beam-Specimen InteractionSEM Operating; ParametersApplicationsChromatographic MethodsGeneral; Principles of ChromatographyIon Exchange; ChromatographyGel Permeation ChromatographyGel; Electrophoresis ChromatographyHigh-Performance Liquid; ChromatographyGas ChromatographyQuantitative Analysis; MethodsInfrared Spectroscopy and UV/Vis; SpectroscopyInfrared Radiation; SpectroscopyUltraviolet/Visible SpectroscopyMacro and Micro Thermal AnalysesMacro and Micro Differential Scanning; CalorimetryIsothermal Titration CalorimetryThermogravimetric AnalysisLaser Confocal Fluorescence; MicroscopyFluorescence and Fluorescent DyesFluorescence; MicroscopyLaser Confocal Fluorescence; MicroscopyApplications of LCFMIndex |
| Withdrawn status | Damaged status | Not for loan | Home library | Current library | Date acquired | Source of acquisition | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|
| UE-Central Library | UE-Central Library | 26.11.2018 | U.E.24340 | 620.110287 Z632 | T10024 | 20.07.2022 | 26.11.2018 | Books |
