ZnO nanorods have grown on glass substrates by Chemical Bath Deposition. Effect of
reactants (Zinc Nitrate and HMTA) concentration on growth, morphology and
dielectric properties of ZnO nanorods has investigated. Structural properties of ZnO
nanorods investigated by X-ray diffraction technique revealed that the intensity of
peak corresponding to (002) plane has observed to increase as the concentration of
reactant increases from 25 to 100 mM. The average crystallite size estimated by
Scherrer’s equation is 10.05, 12.27, 10.21, 9.67 and 10.35 nm for the concentrations
of 25, 50, 75, 100 and 125 mM, respectively. Size and shape of the nanorods observed
through micrographs obtained from Scanning Electron Microscope showed that
morphology of ZnO nanorods exhibit significant dependence concentration of
reactants. Impedance analyzer has used to study the dielectric properties of nanorods
and results showed high magnitudes of dielectric constant at high frequency due to
polarization presenting abnormal behavior of semiconducting materials. The observed
characteristics of ZnO nanorods demonstrated that they would be viable in advanced
electronic and optoelectronic applications.