Advances in electronics and electron physics. / edited by Peter W. Hawkes
Material type: Continuing resourceSeries: ; 62Publication details: New York, N.Y. : Academic Press, 1984Description: illustrations ; 24 cmISSN:- 0120146622
- 621.381/05 19 H3924
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621.3810287 L8978 Electronic testing and fault diagnosis | 621.381042 Si581 Testing methods and reliability- Electronics / | 621.38105 H3924 Advances in electronics and electron physics. | 621.38105 H3924 Advances in electronics and electron physics. | 621.381076 C2861 2000 solved problems in electronics | 621.381076 C2861 2000 solved problems in electronics | 621.3813 C6912 Foundations for microwave engineering |
Published: Boston, Mass., <1989>-1994.
includes index
I. Spin polarized electrons in solid-state physics
1. Introduction
2. Experimental techniques
3. Magnetism in metals
4. Magnetism in systems with localized magnetic moments
5. The symmetry of electronic states
6. The spin dependence of the elastic scattering of electrons from solids
7. Secondary electrons
8. Surface magneto chemistry
9. Surface magnetization curves
10. Conclusion
II. Predictions of deep-impurity-level energies in semiconductors
11. Introduction
12. What is a deep trap?
13. The defect molecule picture
14. The Koster-slater green’s function method
15. The tight-binding method
16. General theoretical results
17. Empirical trends in trap-level energies of point defects
18. Empirical trends in g-factors of deep impurities
19. Predictions
20. Chemical trends in transition metal impurities
III. Recent advances in the electron microscopy of materials
21. Introduction to electron optical instrumentation
22. Advances in instrument
23. Developments in imaging in the electron microscope
24. Crystallographic information in the electron microscope
25. Chemical analysis in the electron microscope
26. Combination of techniques
27. Conclusion
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