Materials characterization techniques /
Zhang, Sam.
Materials characterization techniques / Sam Zhang, Lin Li, Ashok Kumar. - Boca Raton : CRC Press, 2009 - 328 p. : ill. ; 25 cm.
PrefaceIntroductionContact Angle in Surface; AnalysisMeasuring Contact AngleDetermining Surface Energy of a Homogeneous Solid SurfaceWork ExamplesX-ray; Photoelectron Spectroscopy and Auger Electron; SpectroscopyAtomic Model and Electron; ConfigurationPrinciples of XPS and AESInstrumentationRoutine Limits of XPSXPS Applications and Case StudiesAES ApplicationsScanning Tunneling; Microscopy and Atomic Force MicroscopyWorking; PrincipleInstrumentationModes of OperationDifferences between STM and AFMApplicationsX-ray DiffractionX-ray; Characteristics and GenerationLattice Planes and Bragg's; LawPowder DiffractionThin Film DiffractionTexture; MeasurementGrazing Angle X-ray DiffractionTransmission; Electron MicroscopyBasics of Transmission Electron; MicroscopesReciprocal LatticeSpecimen PreparationBright-Field and Dark-Field ImagesElectron Energy Loss; SpectroscopyScanning Electron MicroscopyIntroduction to Scanning Electron MicroscopesElectron Beam-Specimen InteractionSEM Operating; ParametersApplicationsChromatographic MethodsGeneral; Principles of ChromatographyIon Exchange; ChromatographyGel Permeation ChromatographyGel; Electrophoresis ChromatographyHigh-Performance Liquid; ChromatographyGas ChromatographyQuantitative Analysis; MethodsInfrared Spectroscopy and UV/Vis; SpectroscopyInfrared Radiation; SpectroscopyUltraviolet/Visible SpectroscopyMacro and Micro Thermal AnalysesMacro and Micro Differential Scanning; CalorimetryIsothermal Titration CalorimetryThermogravimetric AnalysisLaser Confocal Fluorescence; MicroscopyFluorescence and Fluorescent DyesFluorescence; MicroscopyLaser Confocal Fluorescence; MicroscopyApplications of LCFMIndex
9781420042948 (alk. paper) 1420042947 (alk. paper)
Materials--Testing.
620.1/10287 / Z632
Materials characterization techniques / Sam Zhang, Lin Li, Ashok Kumar. - Boca Raton : CRC Press, 2009 - 328 p. : ill. ; 25 cm.
PrefaceIntroductionContact Angle in Surface; AnalysisMeasuring Contact AngleDetermining Surface Energy of a Homogeneous Solid SurfaceWork ExamplesX-ray; Photoelectron Spectroscopy and Auger Electron; SpectroscopyAtomic Model and Electron; ConfigurationPrinciples of XPS and AESInstrumentationRoutine Limits of XPSXPS Applications and Case StudiesAES ApplicationsScanning Tunneling; Microscopy and Atomic Force MicroscopyWorking; PrincipleInstrumentationModes of OperationDifferences between STM and AFMApplicationsX-ray DiffractionX-ray; Characteristics and GenerationLattice Planes and Bragg's; LawPowder DiffractionThin Film DiffractionTexture; MeasurementGrazing Angle X-ray DiffractionTransmission; Electron MicroscopyBasics of Transmission Electron; MicroscopesReciprocal LatticeSpecimen PreparationBright-Field and Dark-Field ImagesElectron Energy Loss; SpectroscopyScanning Electron MicroscopyIntroduction to Scanning Electron MicroscopesElectron Beam-Specimen InteractionSEM Operating; ParametersApplicationsChromatographic MethodsGeneral; Principles of ChromatographyIon Exchange; ChromatographyGel Permeation ChromatographyGel; Electrophoresis ChromatographyHigh-Performance Liquid; ChromatographyGas ChromatographyQuantitative Analysis; MethodsInfrared Spectroscopy and UV/Vis; SpectroscopyInfrared Radiation; SpectroscopyUltraviolet/Visible SpectroscopyMacro and Micro Thermal AnalysesMacro and Micro Differential Scanning; CalorimetryIsothermal Titration CalorimetryThermogravimetric AnalysisLaser Confocal Fluorescence; MicroscopyFluorescence and Fluorescent DyesFluorescence; MicroscopyLaser Confocal Fluorescence; MicroscopyApplications of LCFMIndex
9781420042948 (alk. paper) 1420042947 (alk. paper)
Materials--Testing.
620.1/10287 / Z632
