| 000 | 01129nam a22002057a 4500 | ||
|---|---|---|---|
| 999 |
_c19315 _d19315 |
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| 005 | 20200601144249.0 | ||
| 008 | 191203b ||||| |||| 00| 0 eng d | ||
| 020 | _a9789332535169 (pbk) | ||
| 040 | _cPK-IsLIS | ||
| 082 |
_a548.83 _bC898 |
||
| 100 | _aCullity, B. D. | ||
| 245 |
_aElements of X-ray diffraction _c/ B. D. Cullity & S. R. Stock |
||
| 250 | _a3rd ed. | ||
| 260 |
_aUttar Pradesh : _bPearson Education, _c2018 |
||
| 300 | _a652 p. | ||
| 650 | _aX-rays--Diffraction | ||
| 650 | _aX-ray crystallography | ||
| 942 | _cBK | ||
| 505 | 0 | _aproperties of x-rays; geometry of crystals; diffraction I: geometry; diffraction II: intensities of diffracted beams; diffraction III: real samples; diffraction measurements; powder photographs; laue photographs; phase identification by x-ray diffraction; determination of crystal structure; phase-diagram determination; quantitative phase analysis; precise parameter measurements; structure of polycrystalline aggregates; stress measurement; orientation of single crystals; crystal quality; polymers; small angle scattering; transmission electron microscopy | |