| 000 | 02357cam a2200265 a 4500 | ||
|---|---|---|---|
| 999 |
_c16272 _d16272 |
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| 001 | 15619091 | ||
| 005 | 20200908103806.0 | ||
| 008 | 090210s2009 fluaf b 001 0 eng | ||
| 020 | _a9780849375583 (hardcover : alk. paper) | ||
| 020 | _a0849375584 (hardcover : alk. paper) | ||
| 040 | _cDLC | ||
| 082 | 0 | 0 |
_a620/.44 _222 _bJ653 |
| 245 | 0 | 0 |
_aHandbook of surface and interface analysis : _bmethods for problem-solving _c/ John C. Rivière, Sverre Myhra. |
| 250 | _a2nd ed. | ||
| 260 |
_aBoca Raton : _bCRC Press, _c2009 |
||
| 300 |
_axx, 651 p., [8] p. of plates : _bill. (some col.) ; _c26 cm. |
||
| 650 | 0 |
_aSurfaces (Physics) _xAnalysis. |
|
| 650 | 0 |
_aInterfaces (Physical sciences) _xAnalysis. |
|
| 650 | 0 | _aSurface chemistry. | |
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. |
|
| 700 | 1 | _aRivière, J. C. | |
| 700 | 1 | _aMyhra, S. | |
| 942 | _cBK | ||
| 505 | 0 | _aIntroduction, J. C. Riviere and S. MyhraProblem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. RivierePhotoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. HoflundIon Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. RadingSurface and Interface Analysis by Scanning Probe Microscopy, S. MyhraTransmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical AttachmentsJ. M. TitchmarshSynchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. PrinceQuantifi cation of Surface and Near-Surface Composition by AES and XPS, S. TougaardStructural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. TitchmarshIn-Depth Analysis/Profiling, F. Reniers and C. R. TewellCharacterization of Nanostructured Materials, M. Werner, A. Crossley, and C. JohnstonProblem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. MartinProblem-Solving Methods in Surface Analysis Metallurgy, R. K. WildComposites, P. M. A. SherwoodMinerals, Ceramics, and Glasses, R. St. C. Smart and Z. ZhangCatalyst Characterization, W. E. S. Unger and T. GrossSurface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. GriesserAdhesion Science and Technology, J. F. WattsElectron Spectroscopy in Corrosion Science, J. E. Castle | |