Handbook of surface and interface analysis : methods for problem-solving
/ John C. Rivière, Sverre Myhra.
- 2nd ed.
- Boca Raton : CRC Press, 2009
- xx, 651 p., [8] p. of plates : ill. (some col.) ; 26 cm.
Introduction, J. C. Riviere and S. MyhraProblem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. RivierePhotoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. HoflundIon Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. RadingSurface and Interface Analysis by Scanning Probe Microscopy, S. MyhraTransmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical AttachmentsJ. M. TitchmarshSynchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. PrinceQuantifi cation of Surface and Near-Surface Composition by AES and XPS, S. TougaardStructural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. TitchmarshIn-Depth Analysis/Profiling, F. Reniers and C. R. TewellCharacterization of Nanostructured Materials, M. Werner, A. Crossley, and C. JohnstonProblem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. MartinProblem-Solving Methods in Surface Analysis Metallurgy, R. K. WildComposites, P. M. A. SherwoodMinerals, Ceramics, and Glasses, R. St. C. Smart and Z. ZhangCatalyst Characterization, W. E. S. Unger and T. GrossSurface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. GriesserAdhesion Science and Technology, J. F. WattsElectron Spectroscopy in Corrosion Science, J. E. Castle