Elements of X-ray diffraction / B. D. Cullity & S. R. Stock
Material type:
TextPublication details: Uttar Pradesh : Pearson Education, 2018Edition: 3rd edDescription: 652 pISBN: - 9789332535169 (pbk)
- 548.83 C898
Contents:
properties of x-rays;
geometry of crystals;
diffraction I: geometry;
diffraction II: intensities of diffracted beams;
diffraction III: real samples;
diffraction measurements;
powder photographs;
laue photographs;
phase identification by x-ray diffraction;
determination of crystal structure;
phase-diagram determination;
quantitative phase analysis;
precise parameter measurements;
structure of polycrystalline aggregates;
stress measurement;
orientation of single crystals;
crystal quality;
polymers;
small angle scattering;
transmission electron microscopy
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
|
UE-Central Library | 548.83 C898 (Browse shelf(Opens below)) | c. 1 | Available | T12952 | |
|
Books
|
UE-Central Library | 548.83 C898 (Browse shelf(Opens below)) | c. 2 | Available | T12953 |
properties of x-rays;
geometry of crystals;
diffraction I: geometry;
diffraction II: intensities of diffracted beams;
diffraction III: real samples;
diffraction measurements;
powder photographs;
laue photographs;
phase identification by x-ray diffraction;
determination of crystal structure;
phase-diagram determination;
quantitative phase analysis;
precise parameter measurements;
structure of polycrystalline aggregates;
stress measurement;
orientation of single crystals;
crystal quality;
polymers;
small angle scattering;
transmission electron microscopy
There are no comments on this title.