MARC details
000 -LEADER |
fixed length control field |
02357cam a2200265 a 4500 |
001 - CONTROL NUMBER |
control field |
15619091 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20200908103806.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
090210s2009 fluaf b 001 0 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780849375583 (hardcover : alk. paper) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0849375584 (hardcover : alk. paper) |
040 ## - CATALOGING SOURCE |
Transcribing agency |
DLC |
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620/.44 |
Edition number |
22 |
Item number |
J653 |
245 00 - TITLE STATEMENT |
Title |
Handbook of surface and interface analysis : |
Remainder of title |
methods for problem-solving |
Statement of responsibility, etc |
/ John C. Rivière, Sverre Myhra. |
250 ## - EDITION STATEMENT |
Edition statement |
2nd ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Place of publication, distribution, etc |
Boca Raton : |
Name of publisher, distributor, etc |
CRC Press, |
Date of publication, distribution, etc |
2009 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xx, 651 p., [8] p. of plates : |
Other physical details |
ill. (some col.) ; |
Dimensions |
26 cm. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Surfaces (Physics) |
General subdivision |
Analysis. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Interfaces (Physical sciences) |
General subdivision |
Analysis. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Surface chemistry. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Surfaces (Technology) |
General subdivision |
Analysis. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Rivière, J. C. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Myhra, S. |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Koha item type |
Books |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Introduction, J. C. Riviere and S. MyhraProblem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. RivierePhotoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. HoflundIon Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. RadingSurface and Interface Analysis by Scanning Probe Microscopy, S. MyhraTransmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical AttachmentsJ. M. TitchmarshSynchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. PrinceQuantifi cation of Surface and Near-Surface Composition by AES and XPS, S. TougaardStructural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. TitchmarshIn-Depth Analysis/Profiling, F. Reniers and C. R. TewellCharacterization of Nanostructured Materials, M. Werner, A. Crossley, and C. JohnstonProblem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. MartinProblem-Solving Methods in Surface Analysis Metallurgy, R. K. WildComposites, P. M. A. SherwoodMinerals, Ceramics, and Glasses, R. St. C. Smart and Z. ZhangCatalyst Characterization, W. E. S. Unger and T. GrossSurface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. GriesserAdhesion Science and Technology, J. F. WattsElectron Spectroscopy in Corrosion Science, J. E. Castle |