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Handbook of surface and interface analysis : (Record no. 16272)

MARC details
000 -LEADER
fixed length control field 02357cam a2200265 a 4500
001 - CONTROL NUMBER
control field 15619091
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200908103806.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090210s2009 fluaf b 001 0 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780849375583 (hardcover : alk. paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0849375584 (hardcover : alk. paper)
040 ## - CATALOGING SOURCE
Transcribing agency DLC
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620/.44
Edition number 22
Item number J653
245 00 - TITLE STATEMENT
Title Handbook of surface and interface analysis :
Remainder of title methods for problem-solving
Statement of responsibility, etc / John C. Rivière, Sverre Myhra.
250 ## - EDITION STATEMENT
Edition statement 2nd ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Boca Raton :
Name of publisher, distributor, etc CRC Press,
Date of publication, distribution, etc 2009
300 ## - PHYSICAL DESCRIPTION
Extent xx, 651 p., [8] p. of plates :
Other physical details ill. (some col.) ;
Dimensions 26 cm.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces (Physics)
General subdivision Analysis.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Interfaces (Physical sciences)
General subdivision Analysis.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surface chemistry.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Surfaces (Technology)
General subdivision Analysis.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Rivière, J. C.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Myhra, S.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction, J. C. Riviere and S. MyhraProblem Solving: Strategy, Tactics, and Resources, S. Myhra and J. C. RivierePhotoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS), V. Y. Young and G. B. HoflundIon Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), B. Hagenhoff, R. Kersting, and D. RadingSurface and Interface Analysis by Scanning Probe Microscopy, S. MyhraTransmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical AttachmentsJ. M. TitchmarshSynchrotron-Based Techniques, A. R. Gerson, D. J. Cookson, and K. C. PrinceQuantifi cation of Surface and Near-Surface Composition by AES and XPS, S. TougaardStructural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy, J. M. TitchmarshIn-Depth Analysis/Profiling, F. Reniers and C. R. TewellCharacterization of Nanostructured Materials, M. Werner, A. Crossley, and C. JohnstonProblem-Solving Methods in Tribology with Surface-Specifi c Techniques, C. Donnet and J.-M. MartinProblem-Solving Methods in Surface Analysis Metallurgy, R. K. WildComposites, P. M. A. SherwoodMinerals, Ceramics, and Glasses, R. St. C. Smart and Z. ZhangCatalyst Characterization, W. E. S. Unger and T. GrossSurface Analysis of Biomaterials, M. Jasieniak, D. Graham, P. Kingshott, L. J. Gamble, and H. J. GriesserAdhesion Science and Technology, J. F. WattsElectron Spectroscopy in Corrosion Science, J. E. Castle
Holdings
Withdrawn status Damaged status Not for loan Home library Current library Date acquired Source of acquisition Full call number Barcode Date last seen Price effective from Koha item type
      UE-Central Library UE-Central Library 26.11.2018 U.E.24244 620.44 J653 T9946 26.11.2018 26.11.2018 Books
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